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1

Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode

R. Possamai Bastos, F. Sill Torres, G. Di Natale, M. Flottes, B. Rouzeyre

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 893 KB

english, 2012

2

Scan attacks on side-channel and fault attack resistant public-key implementations

Jean Da Rolt, Amitabh Das, Santosh Ghosh, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede

Journal:

Journal of Cryptographic Engineering

Year:

2012

Language:

english

File:

PDF, 663 KB

english, 2012

3

[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Mutation Sampling Technique for the Generation of Structural Test Data

Scholive, M., Beroulle, V., Robach, C., Flottes, M.L., Rouzeyre, B.

Year:

2005

Language:

english

File:

PDF, 93 KB

english, 2005

4

Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection

Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G.

Journal:

Microelectronics Reliability

Year:

2013

Language:

english

File:

PDF, 1.38 MB

english, 2013

5

Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS

Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G., Sarafianos, A.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 768 KB

english, 2014

6

[IEEE 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Villach, Austria (2013.06.24-2013.06.27)] Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - A JTAG based 3D DfT architecture using automatic die detection

Fkih, Yassine, Vivet, Pascal, Rouzeyre, Bruno, Flottes, Marie-lise, Di Natale, Giorgio

Year:

2013

Language:

english

File:

PDF, 238 KB

english, 2013

7

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Power consumption traces realignment to improve differential power analysis

Natale, G. Di, Flottes, M.L., Rouzeyre, B., Valka, M., Real, D.

Year:

2011

Language:

english

File:

PDF, 701 KB

english, 2011

8

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - A smart test controller for scan chains in secure circuits

Da Rolt, Jean, Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno

Year:

2013

Language:

english

File:

PDF, 133 KB

english, 2013

9

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Bretagnon, T., Bastide, G., Rouzeyre, M.

Journal:

Physical Review B

Year:

1990

Language:

english

File:

PDF, 516 KB

english, 1990

10

in p -type InP: A charge-controlled bistable model

Bretagnon, T., Bastide, G., Rouzeyre, M.

Journal:

Physical Review B

Year:

1989

Language:

english

File:

PDF, 321 KB

english, 1989

11

Thermal Transformation of the Electron-Irradiation-Induced Defect H4 in p Type InP

Bretagnon, Th., Bastide, G., Rouzeyre, M.

Journal:

Materials Science Forum

Year:

1986

File:

PDF, 350 KB

1986

12

[Presses Polytech. Univ. Romandes ISCAS 2000 Geneva. 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings - Geneva, Switzerland (28-31 May 2000)] 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353) - A controller resynthesis based method for improving datapath testability

Flottes, M.L., Rouzeyre, B., Volpe, L.

Year:

2000

Language:

english

File:

PDF, 293 KB

english, 2000

13

[IEEE 2017 22nd IEEE European Test Symposium (ETS) - Limassol, Cyprus (2017.5.22-2017.5.26)] 2017 22nd IEEE European Test Symposium (ETS) - Scan chain encryption for the test, diagnosis and debug of secure circuits

Da Silva, Mathieu, Flottes, Marie-lise, Di Natale, Giorgio, Rouzeyre, Bruno, Prinetto, Paolo, Restifo, Marco

Year:

2017

Language:

english

File:

PDF, 647 KB

english, 2017

14

Preventing Scan Attacks on Secure Circuits Through Scan Chain Encryption

Da Silva, Mathieu, Flottes, Marie-Lise, Di Natale, Giorgio, Rouzeyre, Bruno

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2018

Language:

english

File:

PDF, 3.21 MB

english, 2018

15

Assessing body built-in current sensors for detection of multiple transient faults

Viera, R.A.C., Dutertre, J.-M., Flottes, M.-L., Potin, O., Natale, G. Di, Rouzeyre, B., Bastos, R. Possamai

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 1.96 MB

english, 2018

16

[IEEE 2018 IEEE 3rd International Verification and Security Workshop (IVSW) - Costa Brava, Spain (2018.7.2-2018.7.4)] 2018 IEEE 3rd International Verification and Security Workshop (IVSW) - A New Secure Stream Cipher for Scan Chain Encryption

Da Silva, Mathieu, Valea, Emanuele, Flottes, Marie-Lise, Dupuis, Sophie, Di Natale, Giorgio, Rouzeyre, Bruno

Year:

2018

Language:

english

File:

PDF, 232 KB

english, 2018

17

A Survey on Security Threats and Countermeasures in IEEE Test Standards

Valea, Emanuele, Da Silva, Mathieu, Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno

Journal:

IEEE Design and Test

Year:

2019

File:

PDF, 1.04 MB

2019

18

[IEEE 2019 IEEE 4th International Verification and Security Workshop (IVSW) - Rhodes Island, Greece (2019.7.1-2019.7.3)] 2019 IEEE 4th International Verification and Security Workshop (IVSW) - A Comprehensive Approach to a Trusted Test Infrastructure

Merandat, Marc, Reynaud, Vincent, Valea, Emanuele, Quevremont, Jerome, Valette, Nicolas, Maistri, Paolo, Leveugle, Regis, Flottes, Marie-Lise, Dupuis, Sophie, Rouzeyre, Bruno, Di Natale, Giorgio

Year:

2019

File:

PDF, 664 KB

2019

19

[IEEE 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Napoli, Italy (2020.7.13-2020.7.15)] 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - A Secure Scan Controller for Protecting Logic Locking

Nguyen, Quang-Linh, Valea, Emanuele, Flottes, Marie-Lise, Dupuis, Sophie, Rouzeyre, Bruno

Year:

2020

File:

PDF, 346 KB

2020

20

[IEEE 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Napoli, Italy (2020.7.13-2020.7.15)] 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

Azais, F., Bernard, S., Comte, M., Deveautour, B., Dupuis, S., Badawi, H. El, Flottes, M.-L., Girard, P., Kerzerho, V., Latorre, L., Lefevre, F., Rouzeyre, B., Valea, E., Vayssadel, T., Virazel, A.

Year:

2020

File:

PDF, 536 KB

2020

21

Effect of a deep electron trap with strong lattice relaxation and of interface states on the C-2=ƒ(V) characteristics of Au-CdS Schottky diodes

M. Housin, M. Fialin, G. Bastide, G. Sagnes, M. Rouzeyre

Journal:

Journal of Crystal Growth

Year:

1982

Language:

english

File:

PDF, 435 KB

english, 1982

22

Electro magneto reflexion du germanium a 1,5°K

M Rouzeyre, H Mathieu, D Auvergne, J Camassel

Journal:

Solid State Communications

Year:

1969

Language:

french

File:

PDF, 262 KB

french, 1969

23

Depth penetration of the transverse surface wave in photoconducting CdS

M. Rouzeyre, G. Cambon

Journal:

Solid State Communications

Year:

1972

Language:

english

File:

PDF, 183 KB

english, 1972

24

Optical properties of electron irradiation induced defects in InP

D. Bayaa, G. Bastide, M. Rouzeyre, A. Sibille

Journal:

Solid State Communications

Year:

1984

Language:

english

File:

PDF, 251 KB

english, 1984

25

Lattice coupling strength of electron-induced-irradiated defects in InP

G. Bastide, D. Bayaa, M. Rouzeyre

Journal:

Solid State Communications

Year:

1986

Language:

english

File:

PDF, 394 KB

english, 1986

26

Localized defects in p-CdTe:Cu doped by copper incorporation during Bridgman growth

J.P. Laurenti, G. Bastide, M. Rouzeyre, R. Triboulet

Journal:

Solid State Communications

Year:

1988

Language:

english

File:

PDF, 366 KB

english, 1988

27

Migration des ions dans l'oxyde de structures MIS (AlAl2O3Si)

B. Pistoulet, M. Rouzeyre, D. Auvergne

Journal:

Solid-State Electronics

Year:

1969

File:

PDF, 581 KB

1969

28

Physical properties of the deep X electron trap responsible for long time persistent photocapacitance in CdS

Malik Housin, Michel Fialin, Georges Sagnes, Gérard Bastide, M. Rouzeyre

Journal:

Year:

1983

Language:

english

File:

PDF, 269 KB

english, 1983

29

Multisaturation process in photoconducting CdS

J. Attal, M. Rouzeyre

Journal:

Journal of Physics and Chemistry of Solids

Year:

1973

Language:

english

File:

PDF, 756 KB

english, 1973

30

Photoluminescence and Optical Properties of Lithium-Doped Mgx Zn1−x Te Alloys

S. Demian, F. El Akkad, B. Farag, H. Mathieu, M. Rouzeyre, J. Chevallier

Journal:

physica status solidi (a)

Year:

1984

Language:

english

File:

PDF, 436 KB

english, 1984

31

Sur le mode de fonctionnement des transistors à interface métal-semiconducteur

B. Pistoulet, M. Rouzeyre

Journal:

physica status solidi (b)

Year:

1965

File:

PDF, 678 KB

1965

32

Contribution á l'étude des phénomènes de transport dans les structures aluminium–alumine–métal

Journal:

physica status solidi (b)

Year:

1967

File:

PDF, 654 KB

1967

33

Securing Scan Control in Crypto Chips

David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre

Journal:

Journal of Electronic Testing

Year:

2007

Language:

english

File:

PDF, 210 KB

english, 2007

34

A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard

G. Di Natale, M. Doulcier, M. L. Flottes, B. Rouzeyre

Journal:

Journal of Electronic Testing

Year:

2009

Language:

english

File:

PDF, 435 KB

english, 2009

35

Thermal ionisation and photoionisation properties of deep traps in n type CdTe

F. Debbag, G. Bastide, M. Rouzeyre

Journal:

Solid State Communications

Year:

1988

Language:

english

File:

PDF, 414 KB

english, 1988

36

Operators allocation in the silicon compiler SCOOP

B. Rouzeyre, T. Ezzedine, G. Sagnes

Journal:

Integration, the VLSI Journal

Year:

1989

Language:

english

File:

PDF, 555 KB

english, 1989

37

Improving Testability of Non-Scan Designs during Behavioral Synthesis

M.L. Flottes, D. Hammad, B. Rouzeyre

Journal:

Journal of Electronic Testing

Year:

1997

Language:

english

File:

PDF, 158 KB

english, 1997

38

BISTing Datapaths under Heterogeneous Test Schemes

D. Berthelot, M.L. Flottes, B. Rouzeyre

Journal:

Journal of Electronic Testing

Year:

1999

Language:

english

File:

PDF, 149 KB

english, 1999

39

A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis

D. Berthelot, M.L. Flottes, B. Rouzeyre

Journal:

Journal of Electronic Testing

Year:

2001

Language:

english

File:

PDF, 88 KB

english, 2001

40

[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Evaluation of concurrent error detection techniques on the Advanced Encryption Standard

Bousselam, K., Di Natale, G., Flottes, M-L., Rouzeyre, B.

Year:

2010

Language:

english

File:

PDF, 212 KB

english, 2010

41

Self-Test Techniques for Crypto-Devices

Di Natale, G., Doulcier, M., Flottes, M.-L., Rouzeyre, B.

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2010

Language:

english

File:

PDF, 248 KB

english, 2010

42

[IEEE 2007 Ph.D Research in Microelectronics and Electronics Conference - (2007.07.2-2007.07.5)] 2007 Ph.D Research in Microelectronics and Electronics Conference - Systems-on-chip: Use of test data compression technique for reducing test time

Dalmasso, Julien, Flottes, Marie-Lise, Rouzeyre, Bruno

Year:

2007

Language:

english

File:

PDF, 563 KB

english, 2007

43

[IEEE Comput. Soc IEEE International High Level Design Validation and Test Workshop (HLDVT'02) - Cannes, France (27-29 Oct. 2002)] Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. - A simple and effective compression scheme for test pins reduction

Flottes, M.-L., Poirier, R., Rouzeyre, B.

Year:

2002

Language:

english

File:

PDF, 289 KB

english, 2002

44

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - On-chip test comparison for protecting confidential data in secure ICs

Da Rolt, Jean, Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno

Year:

2012

Language:

english

File:

PDF, 200 KB

english, 2012

45

Interface studies and electrical properties of plasma sulfide layers on n-type InP

Klopfenstein, P., Bastide, G., Rouzeyre, M., Gendry, M., Durand, J.

Journal:

Journal of Applied Physics

Year:

1988

Language:

english

File:

PDF, 1.25 MB

english, 1988

46

[IEEE 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - Austin, TX, USA (2013.06.2-2013.06.3)] 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - A bulk built-in sensor for detection of fault attacks

Bastos, R. Possamai, Torres, F. Sill, Dutertre, J.-M., Flottes, M.-L., Di Natale, G., Rouzeyre, B.

Year:

2013

Language:

english

File:

PDF, 613 KB

english, 2013

47

Bleustein-wave amplification in photoconducting CdS

Cambon, G., Fournier, C., Rouzeyre, M.

Journal:

Electronics Letters

Year:

1972

Language:

english

File:

PDF, 551 KB

english, 1972

48

[IEEE Second IEEE International Workshop on Electronic Design, Test and Applications - Perth, Australia (28-30 Jan. 2004)] Second IEEE International Workshop on Electronic Design, Test and Applications - On Using Test Vector Differences for Reducing Test Pin Numbers

Flottes, M.-L., Poirier, R., Rouzeyre, B.

Year:

2004

Language:

english

File:

PDF, 155 KB

english, 2004

49

Nonlinear interaction of acoustic surface waves with carriers

Rouzeyre, M., Sagnes, G.

Journal:

Electronics Letters

Year:

1973

Language:

english

File:

PDF, 567 KB

english, 1973

50

Direct measurement of acoustoelectric amplification parameters in surface acoustic waves

Cambon, G, Rouzeyre, M, Bastide, G

Journal:

Journal of Physics C Solid State Physics

Year:

1975

Language:

english

File:

PDF, 474 KB

english, 1975